Raman and infrared microspectroscopy of the high explosives TNT, PETN, and RDX heated to their melting point and beyond

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1306-1307

  Etz, Edgar S ^a   Gillen, Greg ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544293156     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760488766X     Document Type: Conference Paper

References (6)

1. S.F. Hallowell, Talanta 54 (2001) 447, and R.G. Ewing et al. Talanta 54 (2001) 515.
2. S.F. Hallowell, Talanta 54 (2001) 447, and R.G. Ewing et al. Talanta 54 (2001) 515.
3. C. Cheng et al., J. Forensic Sci. 40 (1995)31, and N.F. Fell et al. J. Raman Spectrosc. 27 (1996) 97.
4. C. Cheng et al., J. Forensic Sci. 40 (1995)31, and N.F. Fell et al. J. Raman Spectrosc. 27 (1996) 97.
5. J. Janni et al, Spectrochim. Acta Part A 53 (1997) 1375; G.T. Long, J. Phys. Chem. B 104 (2000) 2570.
6. J. Janni et al, Spectrochim. Acta Part A 53 (1997) 1375; G.T. Long, J. Phys. Chem. B 104 (2000) 2570.