A high-speed dynamic current sensor for iDD test based on the flipped voltage follower

2003 Southwest Symposium on Mixed-Signal Design, SSMSD 2003

Volumn , Issue , 2003, Pages 208-211

  Ducoudray, G O ^a   Gonzalez Carvajal R ^b   Ramirez Angulo J ^a  

^a NEW MEXICO STATE UNIVERSITY   (United States)

^b UNIVERSIDAD DE SEVILLA   (Spain)

Author keywords

Bandwidth; Circuit simulation; Circuit testing; CMOS technology; Current supplies; Impedance; Low voltage; Mirrors; Rails; Resistors

Indexed keywords

BANDWIDTH; BUFFER AMPLIFIERS; CIRCUIT SIMULATION; CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; MIRRORS; OPTICAL TESTING; RAILS; RESISTORS;

CIRCUIT TESTING; CMOS TECHNOLOGY; CURRENT SENSORS; CURRENT SUPPLIES; CURRENT TESTING; FLIPPED VOLTAGE FOLLOWER; HIGH SPEED; LOW VOLTAGES;

MIXED SIGNAL INTEGRATED CIRCUITS;

EID: 4544292924     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSMSD.2003.1190428     Document Type: Conference Paper

References (10)

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