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Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 278-284
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Sixth-order contribution to the cubic anisotropy in Fe(1 1 1) thin films on Si(1 1 1)
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Author keywords
Epitaxy; Iron; Magnetic measurements; Metal semiconductor magnetic thin film structures; Silicides; Silicon
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Indexed keywords
EPITAXIAL GROWTH;
IRON;
KERR MAGNETOOPTICAL EFFECT;
MAGNETIC ANISOTROPY;
MAGNETIC SUSCEPTIBILITY;
MAGNETIC VARIABLES MEASUREMENT;
MAGNETOMETERS;
MONOLAYERS;
SILICON;
TORQUE;
ANISOTROPY ENERGY;
METAL-SEMICONDUCTOR MAGNETIC THIN FILM STRUCTURES;
SILICIDES;
THIN FILMS;
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EID: 4544286300
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.06.124 Document Type: Conference Paper |
Times cited : (17)
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References (10)
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