CCD camera with electron decelerator for intermediate voltage electron microscopy

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 1378-1379

  Downing, K H ^a   Mooney, P E ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544276432     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604882977     Document Type: Conference Paper

References (0)