Control of bonding at the Cu/(0001) α-Al2O3 interface

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 10-11

  Ruhle M ^a   Oh, S H ^a   Scheu, C ^a   Wagner, T ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544268648     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604882035     Document Type: Conference Paper

References (8)

1. M. Gao, C. Scheu, T. Wagner, W. Kurtz, M. Rühle, Z. Metallkd. 93 (2002) 438.
2. M.W. Finnis, J. Phys. Condens. Matter 8 (1996) 5811.
3. X.-G. Wang, J.R. Smith, M. Scheffler, J. Am. Ceram. Soc. 86 (2003) 696.
4. C. Scheu, G. Dehm, M. Rüble, R. Brydson, Phil. Mag. A 78 (1998) 439.
5. I. Batyrev, A. Alavi, M.W. Finnis, Faraday Disc. 114 (1999) 33.
6. C. Scheu, PhD Thesis, University of Stuttgart (1996).
7. C. Scheu, S. Klein, A.P. Tomsia, M. Rühle, J. Microscopy 208 (2002) 11.
8. The work was supported by the German Science Foundation (DFG) under the contract ER 139/12-1 and through the Graduiertenkolleg "Innere Grenzflächen" GRK 285/3.