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Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1739-1744

Impact of the space environmental conditions on the reliability of a MEMS COTS based system

Author keywords

[No Author keywords available]

Indexed keywords

ACCELEROMETERS; EARTH (PLANET); LAUNCHING; MATHEMATICAL MODELS; PRESSURE MEASUREMENT; RELIABILITY; SENSORS; SPACE RESEARCH;

EID: 4544258683     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.109     Document Type: Conference Paper
Times cited : (7)

References (10)
  • 1
    • 2142808339 scopus 로고    scopus 로고
    • MEMS and microtechnologies for space applications
    • Montréal, Canada, August
    • Pressecq F. MEMS and microtechnologies for space applications. 1st CANEUS Workshop, Montréal, Canada, August 2002.
    • (2002) 1st CANEUS Workshop
    • Pressecq, F.1
  • 6
    • 4544276969 scopus 로고    scopus 로고
    • www.analog.com.
  • 7
    • 0041692417 scopus 로고    scopus 로고
    • Correlation between X-ray microdiffraction and a developed analytical model to measure the residual stresses in suspended structures in MEMS
    • Rigo S, Goudeau P, Desmarres JM, Masri T, Petit JA, Schmitt P. Correlation between X-ray microdiffraction and a developed analytical model to measure the residual stresses in suspended structures in MEMS. J Microelectronics Reliability 2003; 43: 1963-8.
    • (2003) J Microelectronics Reliability , vol.43 , pp. 1963-1968
    • Rigo, S.1    Goudeau, P.2    Desmarres, J.M.3    Masri, T.4    Petit, J.A.5    Schmitt, P.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.