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Volumn 39, Issue 12, 2004, Pages 1849-1859

Effect of substrate temperature on ac conduction properties of amorphous and polycrystalline gase thin films

Author keywords

Chalcogenides; Electrical properties; Thin films; X ray diffraction

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CAPACITANCE; CRYSTAL STRUCTURE; FERMI LEVEL; GALLIUM COMPOUNDS; IRRADIATION; THIN FILMS; X RAY DIFFRACTION;

EID: 4544257586     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2004.06.010     Document Type: Article
Times cited : (10)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.