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Volumn 39, Issue 12, 2004, Pages 1849-1859
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Effect of substrate temperature on ac conduction properties of amorphous and polycrystalline gase thin films
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Author keywords
Chalcogenides; Electrical properties; Thin films; X ray diffraction
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CAPACITANCE;
CRYSTAL STRUCTURE;
FERMI LEVEL;
GALLIUM COMPOUNDS;
IRRADIATION;
THIN FILMS;
X RAY DIFFRACTION;
CHALCOGENIDES;
CORRELATED BARRIER HOPPING;
FREQUENCY LEVEL;
QUANTUM MECHANICAL TUNNELING MODELS;
POLYCRYSTALLINE MATERIALS;
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EID: 4544257586
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/j.materresbull.2004.06.010 Document Type: Article |
Times cited : (10)
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References (25)
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