Improvements for HR- and Cryo-SEM by the VCT 100 high-vacuum cryo transfer system and SEM cooling stage

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 970-971

  Wepf, R ^a   Richter, T ^a   Sattler, M ^a   Kaech, A ^b  

^a BEIERSDORF AG   (Germany)

^b Bal Tec AG   (Liechtenstein)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544240434     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604887713     Document Type: Conference Paper

References (1)

1. M. Ritter et al., Microsc. Microanal. 5 (1999; Suppl. 2) 424.