Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1455-1459

  D'Arcangelo, E ^a   Irace, A ^a   Breglio, G ^a   Spirito, P ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; ELECTRIC POWER UTILIZATION; ENERGY DISSIPATION; INFRARED RADIATION; PROBLEM SOLVING; RADIOMETRY; SIMULATORS; TEMPERATURE DISTRIBUTION;

DEVICE UNDER TEST (DUT); NUMERICAL SIMULATORS; POWER SWITCHES; UNCLAMPED INDUCTIVE SWITCHING (UIS);

MOSFET DEVICES;

EID: 4544231108     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.039     Document Type: Conference Paper

References (8)

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3. J. McGloin, D. Sdrulla, "Estimating the Temperature Rise op Power MOSTETs During the UIS Test", pp. 448-453, 1992
4. Kevin Fischer and Krishna Shenai, "Electrothermal Effects During Unclamped Inductive Switching (UIS} of Power MOSFET's", IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 44, NO. 5, pp. 874-878, 1997
5. K. Chinnaswamy, P. Khandelwal, M. Trivedi, K. Shenai, "Unclamped Inductive Switching Dynamics in Lateral and Vertical Power DMOSFETs", pp. 1085-1092, 1999.
6. K. Fisher and K. Shenai, "Ultra-High Performance Rugged Scaled Power MOSFETs for High-Frequency Power Conversion", Applied Power Electronics Conference and Exposition (APEC), 1996. Conference Proceedings 1996, 11th Annual IEEE, 1996, Volume: 1, pagg. 270-275
7. G. Breglio, P. Spirito, "Experimental detection of time dependent temperature maps in power bipolar transistors", MicroElectronic Journal, vol.31/9-10, pp. 735-739, 2000
8. G. Breglio, N. Rinaldi, P. Spirito, "Thermal Mapping and 3D Numerical Simulation of New Cellular Power MOS Affected by Electro-Thermal Instability", MicroElectronic Journal, vol. 31/9-10, pp. 741-746, 2000