Measurements of slow relaxation times of ferroelectric films by means of resonance method

2006 16th International Crimean Microwave and Telecommunication Technology, CriMiCo

Volumn , Issue , 2006, Pages 778-779

  Kozyrev, A B ^a   Gaidukov, M M ^a   Gagarin, A G ^a   Altynnikov, A G ^a  

^a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; FERROELECTRICITY; IRON; MEASUREMENTS; MICROWAVES; RELAXATION PROCESSES; RELAXATION TIME; RESONANCE; TECHNOLOGY;

(P ,P ,T) MEASUREMENTS; FERROELECTRIC (BARIUM STRONTIUM TITANATE); FERROELECTRIC (FE) FILMS; INTERNATIONAL (CO); RESONANCE METHODS; SLOW RELAXATIONS; TELECOMMUNICATION TECHNOLOGIES; VOLTAGE PULSES;

FERROELECTRIC FILMS;

EID: 45249106597     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CRMICO.2006.256197     Document Type: Conference Paper

References (4)

1. A. B. Kozyrev, V. N. Keis, G. Koepf, R. Yandrofski et al. Procedure of microwave investigations of ferroelectric films and tunable microwave devices based on ferroelectric films. Microelectronic Engineering, 1995, 29, p. 257-260.
2. 3 thin films due to the oxygen vacancy redistribution. App. Phys. Lett., 2001, 78, p. 3866.
3. Russian source
4. Russian source