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Volumn 11, Issue 1 PART 1, 2007, Pages 509-516
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Novel technique of MEA sample preparation using a focused ion beam for scanning electron microscope investigation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
(1 1 0) SURFACE;
CARBON PARTICLES;
CATALYST LAYER (CL);
ELECTROCHEMICAL SOCIETY (ECS);
FLAT SURFACES;
FOCUSED ION BEAM (FEB);
IONOMER;
MEMBRANE ELECTROLYTE ASSEMBLY (MEA);
MICRO-PORES;
NOVEL METHODS;
POROUS STRUCTURES;
PROTON EXCHANGE MEMBRANE FUEL CELL (PEM-FC);
PROTON-CONDUCTION;
SAMPLE PREPARATIONS;
SCANNING ELECTRON MICROSCOPE (SEM);
SCANNING ELECTRON MICROSCOPE INVESTIGATION;
SEM IMAGING;
BEAM PLASMA INTERACTIONS;
BLOOD VESSEL PROSTHESES;
CARBON;
CELLS;
DIRECT ENERGY CONVERSION;
ELECTRIC BATTERIES;
ELECTROCHEMISTRY;
ELECTROLYSIS;
ELECTRON BEAM LITHOGRAPHY;
ELECTRON MICROSCOPES;
ELECTRONS;
EPOXY RESINS;
FOCUSED ION BEAMS;
FUEL CELLS;
FUELS;
GAS FUEL PURIFICATION;
ION BEAMS;
ION BOMBARDMENT;
ION EXCHANGE MEMBRANES;
MEMBRANES;
METALLIZING;
MICROSCOPES;
OPTICAL INSTRUMENTS;
PAINTING;
POLYMERS;
PRECIOUS METALS;
PROTON EXCHANGE MEMBRANE FUEL CELLS (PEMFC);
PROTONS;
RESINS;
SCANNING;
SECONDARY EMISSION;
SILVER;
SOLID OXIDE FUEL CELLS (SOFC);
STANDARDS;
SURFACE PROPERTIES;
SURFACES;
WATER POLLUTION;
CHARGED PARTICLES;
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EID: 45249105281
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.2780964 Document Type: Conference Paper |
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Times cited : (10)
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References (6)
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