Algorithms comparation of feature extraction and multi-class classification for fault diagnosis of analog circuit

Proceedings of the 2007 International Conference on Wavelet Analysis and Pattern Recognition, ICWAPR '07

Volumn 2, Issue , 2007, Pages 566-572

  Wang, An Na ^a   Liu, Jun Fang ^a   Yuan, Wen Jing ^a   Li, Hua ^a  

^a NORTHEASTERN UNIVERSITY   (China)

Author keywords

Fault diagnosis; Feature extraction; Pattern recognition

Indexed keywords

ANALOG CIRCUITS; CLASSIFICATION (OF INFORMATION); CLASSIFIERS; COMPUTER AIDED DIAGNOSIS; EXTRACTION; FAILURE ANALYSIS; FAULT DETECTION; FEATURE EXTRACTION; PATTERN RECOGNITION; SUPPORT VECTOR MACHINES; TIMING CIRCUITS; VECTORS; WAVELET ANALYSIS;

CLASSIFICATION ACCURACY; CLASSIFICATION PERFORMANCE; FEATURE EXTRACTION METHODS; MULTI-CLASS CLASSIFICATION; OPTIMAL WAVELET PACKET TRANSFORMS; PATTERN RECOGNITION PROBLEMS; SOFT FAULT DIAGNOSIS; WAVELET PACKET TRANSFORMS;

BINARY TREES;

EID: 45149135269     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICWAPR.2007.4420734     Document Type: Conference Paper

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