Reliability assessment of a 1 MV LTD

Digest of Technical Papers-IEEE International Pulsed Power Conference

Volumn , Issue , 2007, Pages 132-134

  Leckbee, J ^a   Maenchen, J ^a   Portillo, S ^a   Cordova, S ^a   Molina, I ^a   Johnson, D L ^b   Kim, A A ^c   Chavez, R ^d   Ziska, D ^d  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b TITAN CORPORATION   (United States)

^c INSTITUTE OF HIGH CURRENT ELECTRONICS   (Russian Federation)

^d KTECH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARCHITECTURAL DESIGN; EXPERIMENTS; JITTER; TIMING JITTER;

(N ,F) RADIOGRAPHY; LARGE AREAS; LINEAR TRANSFORMER DRIVER (LTD); PEAK VOLTAGE; PULSE WIDTH (PW); PULSED-POWER; RELIABILITY ASSESSMENTS; RISE TIME; SANDIA NATIONAL LABORATORIES (SNL);

MICROFLUIDICS;

EID: 45149122355     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PPC.2005.300524     Document Type: Conference Paper

References (2)

1. A. A. Kim, A. N. Bastrikov, S. N. Volkov, V. G. Durakov, B. M. Kovalchuk, and V. A. Sinebryukhov, "Development of the ultra-fast LTD stage," in Proc. 14th IEEE Int. Conf. High-Power Particle Beams, Albuquerque, NM, 2002, pp. 81-84.
2. A. A. Kim, A. N. Bastrikov, S. N. Volkov, V. G. Durakov, B. M. Kovalchuk, and V. A. Sinebryukhov, "1 MV ultrafast LTD generator," in Proc. 14th IEEE Int. Pulsed Power Conf., Dallas, TX, 2003, pp. 853-854.