SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 103, Issue 11, 2008, Pages

Kim model of stress induced by flux pinning in type-II superconductors

(2) Yong, Hua Dong a Zhou, You He b

a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS (China)

b LANZHOU UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; ELECTRIC BATTERIES; ELECTRIC CONDUCTIVITY; EVAPORATIVE COOLING SYSTEMS; FERROMAGNETISM; FLUX PINNING; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELDS; MAGNETIZATION; MAGNETS; PHOTOACOUSTIC EFFECT; POINT DEFECTS; STRESSES; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY;

(001) PARAMETER; (ABIOTIC AND BIOTIC) STRESS; ANALYTIC EXPRESSIONS; BEAN MODELS; CRITICAL STATES; EXTERNAL FIELDS; FIELD COOLING (FC); FLUX DENSITIES; HIGH-TEMPERATURE SUPERCONDUCTORS (HTSE); KIM MODEL; MAGNETIC (CE); MAGNETIZATION PROCESSES; MAGNETOELASTIC (ME) EFFECTS; PLANE STRAINS; SLAB GEOMETRY; STRESS BEHAVIOR; STRESS FIELDS; STRESS INDUCED; TYPE II SUPERCONDUCTORS;

MAGNETISM;

EID: 45149083051 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2936314 Document Type: Article

Times cited : (26)

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