Study of 26Al measurement on the Shanghai Mini-cyclotron based AMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 14, 2008, Pages 3302-3308

  Wang, Shengli ^a   Liu, Yonghao ^a   Li, Deming ^a   Chen, Maobai ^a  

^a SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

Author keywords

25MgH; 26Al; Aluminum; AMS; Background; SMCAMS

Indexed keywords

EID: 44949098622     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.04.007     Document Type: Article

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