Silica-sandwiched Au nanoparticle arrays by a soft PE-CVD/RF sputtering approach

Nanotechnology

Volumn 19, Issue 25, 2008, Pages

  Barreca, Davide ^a   Gasparotto, Alberto ^a   Maccato, Chiara ^a   Tondello, Eugenio ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA; SILICATE MINERALS; SILICON COMPOUNDS;

AU NANO PARTICLES; SYNTHETIC ROUTES;

GOLD;

ARGON; GOLD; NANOPARTICLE; OXYGEN; SILICON DIOXIDE; TETRAMETHOXYSILANE;

ABSORPTION SPECTROSCOPY; ARTICLE; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; INTERFEROMETRY; PRIORITY JOURNAL; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 44949096346     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/25/255602     Document Type: Article

References (45)

1. Dalacu D, Klemberg-Sapieha J E and Martinu L 2001 Surf. Sci. 472 33
2. Cho S H, Lee S, Ku D Y, Lee T S, Cheong B, Kim W M and Lee K S 2004 Thin Solid Films 447/448 68
3. Goettmann F, Moores A, Boissière C, Le Floch P and Sanchez C 2005 Small 1 636
4. Yu S W, Liao H B, Wen W J and Wong G K L 2005 Opt. Mater. 27 1433
5. van Dijk M A, Tchebotareva A L, Orrit M, Lippitz M, Berciaud S, Lasne D, Cognet L and Lounis B 2006 Phys. Chem. Chem. Phys. 8 3486
6. Pissuwan D, Valenzuela S M and Cortie M B 2006 Trends Biotechnol. 24 62
7. Girard C and Dujardin E 2006 J. Opt. A: Pure Appl. Opt. 8 S73
8. Chiaretta D, Milanese D, Menke Y, Ferraris M and Pirri F 2006 J. Non-Cryst. Solids 352 2548
9. Jin C, Zhou H, Wei W and Narayan R 2006 Appl. Phys. Lett. 89 261103
10. Wang Z, Cai X, Chen Q and Li L 2006 Vacuum 80 438
11. Jain P K, El-Sayed I H and El-Sayed M A 2007 Nanotoday 2 18
12. Maier S A, Brongersma M L, Kik P G and Atwater H A 2002 Phys. Rev. B 65 193408
13. Kelly K L, Coronado E, Zhao L L and Schatz G C 2003 J. Phys. Chem. B 107 668
14. Aslan K, Lakowicz J R and Geddes C D 2005 Curr. Opin. Chem. Biol. 9 538
15. Maier S A and Atwater H A 2005 J. Appl. Phys. 98 011101
16. Seo J Y, Cho S, Lim H and Lee S 2006 Curr. Appl. Phys. 6S1 e62
17. Muskens O L, Del Fatti N, Vallée F, Huntzinger J R, Billaud P and Broyer M 2006 Appl. Phys. Lett. 88 063109
18. Pellegrini G, Mattei G, Bello V and Mazzoldi P 2007 Mater. Sci. Eng. C 27 1347
19. Harkati Kerboua C, Lamarre J-M, Martinu L and Roorda S 2007 Nucl. Instrum. Methods Phys. Res. B 257 42 and references therein
20. Noguez C 2005 Opt. Mater. 27 1204
21. Kubo S, Diaz A, Tang Y, Mayer T S, Khoo I C and Mallouk T E 2007 Nano Lett. 7 3418
22. Lamarre J M, Yu Z, Harkati C, Roorda S and Martinu L 2005 Thin Solid Films 479 232 and references therein
23. Battaglin G, Cattaruzza E, Gonella F, Mattei G, Mazzoldi P, Sada C and Zhang X 2000 Nucl. Instrum. Methods Phys. Res. B 166/167 857
24. Tanahashi I, Manabe Y, Tohda T, Sasaki S and Nakamura A 1996 J. Appl. Phys. 79 1244
25. Zhang B P, Masumoto H, Someno Y and Goto T 2002 Mater. Trans. 43 2855
26. Liao H B, Wen W and Wong G K L 2003 J. Appl. Phys. 93 4485
27. Fracassi F, d'Agostino R, Palumbo F, Bellucci F and Monetta T 1996 Thin Solid Films 272 60
28. Barreca D, Gasparotto A, Tondello E, Bruno G and Losurdo M 2004 J. Appl. Phys. 96 1655
29. Armelao L, Barreca D, Gasparotto A, Pierangelo E, Tondello E and Polizzi S 2005 J. Nanosci. Nanotechnol. 5 259
30. Moulder J F, Stickle W F, Sobol P E and Bomben K D 1992 Handbook of X-Ray Photoelectron Spectroscopy ed J Chastain (Eden Prairie, MN: Perkin Elmer Corporation)
31. NIST X-ray Photoelectron Spectroscopy Database version 3.4 http://srdata.nist.gov/xps (accessed May, 2007)
32. Barreca D, Gasparotto A, Maccato C, Tondello E and Rossetto G 2008 Thin Solid Films doi:10.1016/j.tsf.2008.02.029
33. Armelao L, Barreca D, Bottaro G, Gasparotto A, Gross S, Maragno C and Tondello E 2006 Coord. Chem. Rev. 250 1294 and references therein
34. 2000 Joint Committee on Powder Diffraction Standards (JCPDS) Pattern no 4-784
35. Barreca D, Gasparotto A, Maragno C, Tondello E and Gialanella S 2005 J. Appl. Phys. 97 54311
36. Kreibig U and Vollmer M 1995 Optical Properties of Metal Clusters vol 25 (Berlin: Springer)
37. Tanahashi I, Yoshida M, Manabe Y and Tohda T 1996 Surf. Rev. Lett. 3 1071
38. Liao H B, Xiao R F, Fu J S, Yu P, Wong G K L and Sheng P 1997 Appl. Phys. Lett. 70 1
39. Barreca D, Gasparotto A, Maccato C, Maragno C, Tondello E and Rossetto G 2007 Chem. Vapor Deposition 13 205
40. Massoud H Z, Plummer J D and Irene E A 1985 J. Electrochem. Soc. 132 2685
41. Barreca D, Gasparotto A, Tondello E, Sada C, Polizzi S and Benedetti A 2003 Chem. Vapor Deposition 9 199
42. Barreca D, Gasparotto A, Maragno C, Tondello E and Gialanella S 2007 J. Nanosci. Nanotechnol. 7 2480
43. Armelao L, Barreca D, Bottaro G, Bruno G, Gasparotto A, Losurdo M and Tondello E 2005 Mater. Sci. Eng. C 25 599
44. Briggs D and Seah M P 1983 Practical Surface Analysis (Chichester: Wiley)
45. Shirley D A 1972 Phys. Rev. B 5 4709