Technological scaling and minimization of 1/f noise in SiGe HBTs coupled mode N-Push oscillator/VCO

Asia-Pacific Microwave Conference Proceedings, APMC

Volumn 2, Issue , 2006, Pages 623-626

  Rohde, Ulrich L ^a,b   Poddar, Ajay K ^a,b  

^a IEEE

^b SYNERGY MICROWAVE CORP   (United States)

Author keywords

1 f; N Push; SiGe HBTs; VCO

Indexed keywords

MICROFLUIDICS; MICROWAVES; OSCILLATORS (ELECTRONIC); SEMICONDUCTING GERMANIUM COMPOUNDS; SILICON ALLOYS; THERMAL NOISE;

1 / F NOISE; ASIA PACIFIC; CARRIER FREQUENCY (VC); CONFERENCE PROCEEDINGS; COUPLED MODE OSCILLATORS; COUPLED MODES; DEVICE SCALING; EXPERIMENTAL RESULTS; MIXED SIGNAL APPLICATIONS; NOISE PERFORMANCES; SIGE HBTS; SUB-CIRCUITS; UP-CONVERSION (UC);

COUPLED CIRCUITS;

EID: 44949094270     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APMC.2006.4429498     Document Type: Conference Paper

References (7)

1. U. L. Rohde, A. K. Poddar, and G. Boeck, Modern Microwave Oscillators for Wireless Applications: Theory and Optimization, John Wiley & Sons Inc., 2005.
2. U. L. Rohde and A. K. Poddar," Impact of Device Scaling on Phase Noise in SiGe HBTs UWB VCOs", IEEE, MTT-S, June 2006, California, USA.
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4. U. L. Rohde and A. K. Poddar, " Impact of Device Scaling on Oscillator/VCO Phase Noise in SiGe HBTs," International Semiconductor Device Research Symposium, ISDRS 2005, USA, December 7-9, 2005.
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7. A. Hajimiri and T. H. Lee, " A general theory of phase noise in electrical oscillators, " IEEE J. Solid-State Circuits, vol. 33, no. 2, pp. 179-184, February 1998.