Striped alloy nanowire optical reflectance barcodes prepared from a single plating solution

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Volumn 4, Issue 5, 2008, Pages 597-600

  Bulbarello, Andrea ^a,b   Sattayasamitsathit, Sirilak ^a,c   Crevillen, Agustin G ^a,d   Burdick, Jared ^a   Mannino, Saverio ^b   Kanatharana, Proespichaya ^c   Thavarungkul, Panote ^c   Escarpa, Alberto ^d   Wang, Joseph ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MILAN   (Italy)

^c PRINCE OF SONGKLA UNIVERSITY   (Thailand)

^d UNIVERSITY OF ALCALÁ   (Spain)

Author keywords

Alloys; Barcodes; Nanowires; Reflectance

Indexed keywords

ALLOYS; BAR CODES; ELECTRIC WIRE; GOLD; GOLD PLATING; NANOSTRUCTURES; NANOWIRES; PLATING; PRECIOUS METALS; PROGRAMMING THEORY; REFLECTION; SILVER; SILVER PLATING;

ALLOY COMPOSITIONS; APPLIED (CO); BAR-CODES; DEPOSITION CONDITIONS; ELECTRODE POSITIONING; NANO WIRES; OPTICAL REFLECTANCE; OPTICAL- (OPET); PLATING SOLUTIONS; REFLECTANCE INTENSITY; TEMPLATED;

SILVER ALLOYS;

ALLOY; GOLD; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTROPLATING INDUSTRY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INFORMATION PROCESSING; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; OPTICS; PARTICLE SIZE; PHOTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

ALLOYS; AUTOMATIC DATA PROCESSING; CRYSTALLIZATION; ELECTROPLATING; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GOLD; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS; PARTICLE SIZE; PHOTOMETRY; SURFACE PROPERTIES;

EID: 44949085387     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200701047     Document Type: Article

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