Fragment size estimation without image segmentation

Imaging Science Journal

Volumn 56, Issue 2, 2008, Pages 91-96

  Wang, W X ^a   Bergholm, F ^b  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b HENAN POLYTECHNIC UNIVERSITY   (China)

Author keywords

Automatic particle inspection; Average size; Edge density; Edge detection; Fragment image; Moment based thresholding

Indexed keywords

EID: 44849139942     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1179/174313108X268312     Document Type: Article

References (12)

1. L. Nyberg, O. Carlsson and B. Schmidtbauer: Proc. IMEKO 9th World Congr., Berlin, Germany, May 1982, IMEKO, 293-301.
2. C. L. Lin and J. D. Miller: J. Miner. Metall. Process., 1993, (2), 29-35.
3. W. X. Wang: J. Comput. Geosci., 1999, (25), 71-81.
4. J. Chleifer and B. Tessier: Proc. Fragblast, 2002, 6, (3-4), 321-331.
5. J. Kemeny, E. Mofya, R. Kaunda and P. Lever: Proc. Fragblast, 2002, 6, (3-4), 311-320.
6. H. M. Norbert, W. Tom and W. Palangio: Proc. Fragblast, 2004, 8, (2), 119-136.
7. M. Suk and S. M. Chung: J. Pattern Recogn., 1983, 16, (5), 469-480.
8. N. R. Pal and S. K. Pa: J. Pattern Recogn., 1993, 26, (9), 1277-1294.
9. W. X. Wang: Proc. RSKT2006, Chongqing, China, July 2006, Rough Set and Soft Computation Society, Vol. 4062, 665-670.
10. J. F. Canny: IEEE Trans. Pattern Anal. Mach. Intell., 1986, 8, (6), 679-698.
11. W. H. Tsa: Comput. Vision Graph. Image Process., 1985, 29, 377-393.
12. M. R. Spiegel: 'Mathematical handbook of formulas and tables'; 1992, New York, McGraw-Hill.