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Volumn , Issue , 2007, Pages 219-222
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XRD, XPS and SEM characterization of photoconductive CdS layers deposited by vacuum thermal evaporation
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Author keywords
[No Author keywords available]
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Indexed keywords
(PL) PROPERTIES;
CONFERENCE PROCEEDINGS;
ELECTRONICS TECHNOLOGY;
EMERGING TECHNOLOGIES;
HETERO STRUCTURES;
IN ORDER;
INTERNATIONAL (CO);
LASER TREATMENTS;
PULSE RATE;
VACUUM THERMAL EVAPORATION (VTE);
CADMIUM COMPOUNDS;
COMPUTER NETWORKS;
DATA STORAGE EQUIPMENT;
ELECTRONIC EQUIPMENT MANUFACTURE;
ELECTRONICS PACKAGING;
EVAPORATION;
FIBER OPTIC SENSORS;
HEAT TREATMENT;
MOISTURE;
PACKAGING;
PULSED LASER APPLICATIONS;
PULSED LASER DEPOSITION;
SEMICONDUCTOR QUANTUM DOTS;
SPRINGS (COMPONENTS);
TECHNOLOGY;
VACUUM;
VACUUM EVAPORATION;
VAPORS;
X RAY DIFFRACTION ANALYSIS;
THERMAL EVAPORATION;
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EID: 44849125546
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISSE.2007.4432851 Document Type: Conference Paper |
Times cited : (3)
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References (4)
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