메뉴 건너뛰기




Volumn , Issue , 2007, Pages 219-222

XRD, XPS and SEM characterization of photoconductive CdS layers deposited by vacuum thermal evaporation

Author keywords

[No Author keywords available]

Indexed keywords

(PL) PROPERTIES; CONFERENCE PROCEEDINGS; ELECTRONICS TECHNOLOGY; EMERGING TECHNOLOGIES; HETERO STRUCTURES; IN ORDER; INTERNATIONAL (CO); LASER TREATMENTS; PULSE RATE; VACUUM THERMAL EVAPORATION (VTE);

EID: 44849125546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2007.4432851     Document Type: Conference Paper
Times cited : (3)

References (4)
  • 1
    • 44849132284 scopus 로고    scopus 로고
    • V. Serbezov, P. Shindov, Laser application in Microelectronic and Optoelectronic Manufacturing V, Proc. SPIE 4274, San Jose, CA, USA, (2001), pp. 288
    • V. Serbezov, P. Shindov, Laser application in Microelectronic and Optoelectronic Manufacturing V, Proc. SPIE Vol. 4274, San Jose, CA, USA, (2001), pp. 288
  • 3
    • 44849103942 scopus 로고    scopus 로고
    • P. Chr. Shindov, Electronics ET'2005, Sozopol 2005, pp. 146
    • P. Chr. Shindov, Electronics ET'2005, Sozopol 2005, pp. 146


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.