Measurement of the nonlinear optical properties of semiconductors using the Irradiance Scan technique

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6875, Issue , 2008, Pages

  Gonzalez, Leonel P ^a   Murray, Joel M ^a   Cowan, Vincent M ^b   Guha, Shekhar ^c  

^a GENERAL DYNAMICS INFORMATION TECHNOLOGY   (United States)

^b UNIVERSITY OF DAYTON   (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Free carrier optical nonlinearities; Nonlinear absorption; Nonlinear refraction

Indexed keywords

ABSORPTION; CADMIUM COMPOUNDS; MEASUREMENTS; NONLINEAR OPTICS; OPTICAL PROPERTIES; PIGMENTS; SEMICONDUCTING CADMIUM TELLURIDE;

NONLINEAR ABSORPTION (NLA); NONLINEAR FREQUENCY; NONLINEAR OPTICAL PROPERTIES (NLO); ROOM-TEMPERATURE (RT); SCAN MEASUREMENTS; SCAN TECHNIQUES;

NONLINEAR PROGRAMMING;

EID: 44849103298     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.763152     Document Type: Conference Paper

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