Microstructure and XRD analysis in the interface zone of Mg/Al diffusion bonding

Journal of Materials Processing Technology

Volumn 205, Issue 1-3, 2008, Pages 146-150

  Wang, Juan ^a   Li, Yajiang ^a   Liu, Peng ^a   Geng, Haoran ^b  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b UNIVERSITY OF JINAN   (China)

Author keywords

Diffusion; Intermetallic compounds; Microstructure; X ray diffraction

Indexed keywords

FRACTURE MECHANICS; MICROSTRUCTURE; PHASE INTERFACES; SCANNING ELECTRON MICROSCOPY; SURFACE DIFFUSION; X RAY DIFFRACTION;

FRACTURE MORPHOLOGY; GRAY FRACTURE; MIXED FRACTURES; PHASE CONSTITUENT;

INTERMETALLICS;

EID: 44749083307     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2007.11.096     Document Type: Article

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