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Volumn 100, Issue 21, 2008, Pages

Uncovering a pressure-tuned electronic transition in Bi1.98Sr2.06Y0. 68Cu2O8+δ using raman scattering and X-ray diffraction

(8) Cuk, T a Struzhkin, V V b Devereaux, T P c Goncharov, A F b Kendziora, C A d Eisaki, H e Mao, H K b Shen, Z X a

a SLAC NATIONAL ACCELERATOR LABORATORY (United States)

b GEOPHYSICAL LABORATORY (United States)

c UNIVERSITY OF WATERLOO (Canada)

d NAVAL RESEARCH LABORATORY (United States)

e NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PRESSURE EFFECTS; RAMAN SCATTERING; TUNING; X RAY DIFFRACTION ANALYSIS;

CRITICAL PRESSURE; SPECTRAL WEIGHT TRANSFER;

ELECTRON TRANSITIONS;

EID: 44649194700 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.217003 Document Type: Article

Times cited : (22)

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