The influence of schlieren on in situ optical measurements used for particle characterization

Limnology and Oceanography: Methods

Volumn 6, Issue 3, 2008, Pages 133-143

  Mikkelsen, Ole A ^a   Milligan, Timothy G ^b   Hill, Paul S ^c   Chant, Robert J ^d   Jago, Colin F ^a   Jones, Sarah E ^a   Krivtsov, Vladimir ^a   Mitchelson Jacob, Gay ^a  

^a BANGOR UNIVERSITY   (United Kingdom)

^b BEDFORD INSTITUTE OF OCEANOGRAPHY   (Canada)

^c DALHOUSIE UNIVERSITY   (Canada)

^d RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44649183370     PISSN: None     EISSN: 15415856     Source Type: Journal    
DOI: 10.4319/lom.2008.6.133     Document Type: Article

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