Thin silicon strip devices for direct electron detection in transmission electron microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 591, Issue 1, 2008, Pages 134-137

  Moldovan, Grigore ^a   Li, Xiaobing ^a   Wilshaw, Peter ^a   Kirkland, Angus ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Direct electron detection; Thin silicon strip devices; Transmission electron microscopy

Indexed keywords

DETECTORS; IMAGING SYSTEMS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

DIRECT ELECTRON DETECTION; DIRECT SENSING DEVICES; ELECTRON DETECTION; THIN SILICON STRIP DEVICES;

SEMICONDUCTING SILICON;

EID: 44649179803     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.03.037     Document Type: Article

References (3)

1. Williams D.B., and Carter C.B. Transmission Electron Microscopy: A Textbook for Materials Science (1996), Plenum Press, New York
2. Joy D.C. Monte Carlo Modelling for Electron Microscopy and Microanalysis (1995), University Press, Oxford
3. Meyer R.R., and Kirkland A. Microsc. Res. Techn. 49 (2000) 269