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Volumn 266, Issue 12-13, 2008, Pages 2691-2697

Atomistic simulations of radiation induced defect formation in the Er2O3 sesquioxide

Author keywords

Bixbyite; Defects; Radiation damage

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ERBIUM COMPOUNDS; OXYGEN VACANCIES; POINT DEFECTS; RADIATION DAMAGE;

EID: 44649178622     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.196     Document Type: Article
Times cited : (12)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.