Mechanism of the low thermal expansion in α-Hf2O(PO4)2 and its zirconium analog

Journal of Solid State Chemistry

Volumn 181, Issue 6, 2008, Pages 1413-1418

  Wallez, Gilles ^a   Bregiroux, Damien ^a   Quarton, Michel ^a  

^a PSL RESEARCH UNIVERSITY   (France)

Author keywords

Low thermal expansion materials; Phosphates; X ray diffraction

Indexed keywords

DEFORMATION; HIGH TEMPERATURE EFFECTS; PHOSPHATES; RIETVELD ANALYSIS; THERMAL EXPANSION; X RAY DIFFRACTION;

BRIDGING OXYGENS; HIGH-TEMPERATURE X-RAY DIFFRACTION; LOW THERMAL EXPANSION MATERIALS;

ZIRCONIUM COMPOUNDS;

EID: 44649165577     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2008.02.032     Document Type: Article

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