Monte Carlo simulation of projections in computed tomography

Powder Diffraction

Volumn 23, Issue 2, 2008, Pages 150-153

  Chyba, B ^a   Mantler, M ^a   Reiter, M ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF APPLIED SCIENCES UPPER AUSTRIA   (Austria)

Author keywords

Computed tomography; Fundamental parameters; Industrial metrology; Monte Carlo simulation

Indexed keywords

COMPARISON WITH MEASUREMENTS; EXPERIMENTAL ENVIRONMENT; FLUORESCENT RADIATION; FUNDAMENTAL PARAMETERS; INDUSTRIAL METROLOGY; INSTRUMENTAL PARAMETERS; METROLOGICAL APPLICATIONS; TWO-DIMENSIONAL PROJECTION;

COMPUTERIZED TOMOGRAPHY;

MONTE CARLO METHODS;

EID: 44649161448     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2919045     Document Type: Article

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