A quality control and improvement system based on the total control methodology (TCM)

International Journal of Quality & Reliability Management

Volumn 15, Issue 1, 1998, Pages 13-48

  Yin Kwok, ka ^a   Rao Tummala, V M ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44649156499     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719810197288     Document Type: Article

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