CP with architectural state lookup for functional test generation

Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT

Volumn , Issue , 2006, Pages 111-118

  Gutkovich, B ^a   Moss, A ^a  

^a INTEL CORPORATION   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; CONSTRAINT THEORY; FUNCTIONAL PROGRAMMING; LEARNING ALGORITHMS; TECHNOLOGY;

(ALGORITHMIC) COMPLEXITY; (OTDR) TECHNOLOGY; CONSTRAINT PROGRAMMING (CP); FUNCTIONAL TEST GENERATION; HIGH LEVEL DESIGNS; INTEGRAL PART; INTERNATIONAL (CO); MEMORY ADDRESSING; PROPAGATION ALGORITHMS; SEARCH ALGORITHMS; SINGLE CONSTRAINT; TEST GENERATION PROCESS; TEST GENERATIONS; USE CASES;

TESTING;

EID: 44649154537     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2006.319972     Document Type: Conference Paper

References (6)

1. th IEEE International Workshop on High Level Design Validation and Test, October 2002.
2. B. Gutkovich, B. Spry, M. Sananes, "Cluster Level Testing with SCOUT", Intel Design and Test Technology Conference, 1999.
3. E. Bin, et al., "Using a constraint satisfaction formulation and solution techniques for random test program generation", IBM System Journal, Vol. 41, No 3, 2002
4. ILOG Solver 6.1 Reference Manual, April 2005
5. IA-32 Intel Arohitecture Software Developer's Manual, June 2005.
6. B.M. Smith, "Modeling for Constraint Programming". The 1-st Constraint Programming Summer School, September 2005.