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Volumn 591, Issue 1, 2008, Pages 218-220

Diffusion of charged defects in Tellurium-rich CdTe

Author keywords

Detector grade CdTe; Diffusion; Fermi level effect; Native defects; Self compensation

Indexed keywords

CADMIUM COMPOUNDS; DIFFUSION; FERMI LEVEL; TELLURIUM;

EID: 44649140356     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2008.03.062     Document Type: Article
Times cited : (3)

References (11)
  • 8
    • 44649141630 scopus 로고
    • Shaw D. (Ed), Plenum, London (Chapter 1)
    • In: Shaw D. (Ed). Atomic Diffusion in Semiconductors (1973), Plenum, London (Chapter 1)
    • (1973) Atomic Diffusion in Semiconductors
  • 10
    • 84963809130 scopus 로고
    • Ahmed M.U., Jones E.D., and Capper P. (Eds), INSPEC, London
    • In: Ahmed M.U., Jones E.D., and Capper P. (Eds). EMIS Datareviews Series No. 10, Part B4.2 (1994), INSPEC, London 466
    • (1994) EMIS Datareviews Series No. 10, Part B4.2 , pp. 466


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.