X-ray photoelectron spectroscopy of tin oxide nanolayers

Bulletin of the Russian Academy of Sciences: Physics

Volumn 72, Issue 4, 2008, Pages 504-509

  Domashevskaya, E P ^a   Ryabtsev, S V ^a   Turishchev, S Yu ^a   Kashkarov, V M ^a   Chuvenkova, O A ^a   Yurakov, Yu A ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; INTENSITY RATIO; TIN OXIDE NANOLAYERS; UNBOUND OXYGEN; VALENCE STATES;

TIN OXIDES;

EID: 44649139970     PISSN: 10628738     EISSN: None     Source Type: Journal    
DOI: 10.3103/S1062873808040199     Document Type: Article

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