Radiation damage mechanisms in CsI(Tl) studied by ion beam induced luminescence

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 12-13, 2008, Pages 2723-2728

  Quaranta, Alberto ^a,b   Gramegna, Fabiana ^b   Kravchuk, Vladimir ^b   Scian, Carlo ^a,b  

^a UNIVERSITY OF TRENTO   (Italy)

^b LABORATORI NAZIONALI DI LEGNARO   (Italy)

Author keywords

61.72.Ji; 61.80. x; 78.60.Hk; CsI; Damage rate; Ion beam induced luminescence

Indexed keywords

CONCENTRATION (PROCESS); ION BEAMS; ION BOMBARDMENT; LUMINESCENCE; RADIATION DAMAGE; SURFACE DEFECTS;

DEFECT PRODUCTION; ION BEAM INDUCED LUMINESCENCE; ION BEAM IRRADIATION;

CESIUM ALLOYS;

EID: 44649133860     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.195     Document Type: Article

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