Surface characterisation of daguerreotypes with the optical metrological technique of confocal microscopy

Surface Engineering

Volumn 24, Issue 2, 2008, Pages 138-146

  Ravines, P ^a   Wiegandt, R ^a   Wichern, C M ^b  

^a George Eastman House   (United States)

^b NanoFocus Inc   (United States)

Author keywords

Confocal white light microscopy; Conservation; Daguerreotypes; Optical metrology; Surface metrology; Surface topography

Indexed keywords

AMMONIUM COMPOUNDS; COATED MATERIALS; CONFOCAL MICROSCOPY; DAMAGE DETECTION; OPTICAL MICROSCOPY; SURFACE TOPOGRAPHY;

CONFOCAL WHITE LIGHT MICROSCOPY; DAGUERREOTYPES; OPTICAL METROLOGY; SURFACE METROLOGY;

IMAGE QUALITY;

EID: 44649124292     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/174329408X298175     Document Type: Conference Paper

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