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Volumn 91, Issue 6, 2008, Pages 1817-1819
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Physical modeling and electrodynamic characterization of dielectric slurries by impedance spectroscopy (part II)
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Author keywords
[No Author keywords available]
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Indexed keywords
(PL) PROPERTIES;
COMPOSITE SYSTEMS;
DIELECTRIC CONSTANTS;
DIELECTRIC POWDERS;
ELECTRICAL CHARACTERIZATIONS;
IMPEDANCE SPECTROSCOPY (IS);
IMPEDANCE SPECTROSCOPY MEASUREMENTS;
IMPEDANCE SPECTRUM;
LOW FREQUENCY (LF);
NEW APPROACHES;
NEW METHODS;
PHYSICAL MODEL (PM);
RELIABLE MEASUREMENTS;
SUSPENDED PARTICLES;
VALUABLE INFORMATIONS;
CERAMIC CAPACITORS;
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES;
DIELECTRIC PROPERTIES OF SOLIDS;
DIELECTRIC SPECTROSCOPY;
DIELECTRIC WAVEGUIDES;
INFORMATION SYSTEMS;
MEASUREMENTS;
MODELS;
PERMITTIVITY;
SPECTRUM ANALYSIS;
DIELECTRIC LIQUIDS;
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EID: 44649123279
PISSN: 00027820
EISSN: 15512916
Source Type: Journal
DOI: 10.1111/j.1551-2916.2007.02256.x Document Type: Article |
Times cited : (14)
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References (7)
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