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Volumn 36, Issue 5, 2008, Pages 593-598
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Electric Field Simulation of High-throughput Cell Electrofusion Chip
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Author keywords
Cell fusion; Electrofusion; Electroporation; Finite element analysis; Microelectrode; Simulation
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Indexed keywords
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EID: 44649103316
PISSN: 2533820
EISSN: 18722040
Source Type: Journal
DOI: 10.1016/S1872-2040(08)60033-X Document Type: Article |
Times cited : (14)
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References (17)
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