Error-resistant single-qubit gates with trapped ions

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 77, Issue 5, 2008, Pages

  Timoney, N ^a   Elman, V ^a   Glaser, S ^b   Weiss, C ^a   Johanning, M ^a   Neuhauser, W ^c   Wunderlich, Chr ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRAPS; ERROR CORRECTION; LASER PULSES; OPTIMAL CONTROL SYSTEMS; PARAMETER ESTIMATION; QUANTUM THEORY;

BUILDING BLOCKS; ERROR-RESISTANT SINGLE-QUBIT GATES; SYSTEM PARAMETERS; TRAPPED IONS;

POSITIVE IONS;

EID: 44649101944     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.77.052334     Document Type: Article

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