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Journal of the Ceramic Society of Japan

Volumn 116, Issue 1352, 2008, Pages 545-549

Dielectric properties of MgB2O6 (B5+=Nb, Ta, Sb) at microwave frequencies

(3) Kim, Eung Soo a Kim, Sung Joo a Lee, Hyung Gyu b

a Kyonggi University (South Korea)

b Korea Electronic Technology Institute (KETI) (South Korea)

Author keywords

Bond valence; Mg(ta 1 xsbx)2o6; Mg(ta1 xnbx)2o6; Microwave dielectric properties; Octahedral distortion

Indexed keywords

NATURAL FREQUENCIES; SINTERING;

BOND VALENCES; COMPOSITION RANGES; DIELECTRIC CONSTANTS (K); DIELECTRIC POLARIZABILITIES; MICROWAVE DIELECTRIC PROPERTIES; OCTAHEDRAL DISTORTION; SINTERED SPECIMEN; TEMPERATURE COEFFICIENT OF RESONANT FREQUENCY;

DIELECTRIC PROPERTIES;

EID: 44649098822 PISSN: 18820743 EISSN: 13486535 Source Type: Journal
DOI: 10.2109/jcersj2.116.545 Document Type: Article

Times cited : (10)

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