Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

Journal of Electron Microscopy

Volumn 57, Issue 3, 2008, Pages 83-89

  Biskupek, Johannes ^a   Kaiser, Ute ^a   Falk, Fritz ^b  

^a UNIVERSITY OF ULM   (Germany)

^b Institute for Photonic Technologies   (Germany)

Author keywords

Au nanoparticles; Electron irradiation; HRTEM; In situ TEM

Indexed keywords

GOLD; NANOPARTICLE; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; ELECTRON; HEAT; METHODOLOGY; SURFACE PROPERTY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS; GOLD; HEAT; MICROSCOPY, ELECTRON, TRANSMISSION; NANOPARTICLES; SILICON DIOXIDE; SURFACE PROPERTIES; TEMPERATURE;

CRYSTALLINE MATERIALS; ELECTRON IRRADIATION; ELECTRONS; GOLD COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SILICA; SILICON OXIDES; SUBSTRATES;

AU NANOPARTICLE; CRYSTALLINE SILICONS; ELECTRON-BEAM; GOLD PARTICLES; HIGH DOSE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN-SITU TEM; SILICON SUBSTRATES; SIO 2 LAYER; TRANSPORT PROCESS;

GOLD NANOPARTICLES;

EID: 44649089058     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfn008     Document Type: Article

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