Prospects for precision measurements of atomic helium using direct frequency comb spectroscopy

European Physical Journal D

Volumn 48, Issue 1, 2008, Pages 43-55

  Eyler, E E ^a   Chieda, D E ^a   Stowe, M C ^b   Thorpe, M J ^b   Schibli, T R ^b   Ye, J ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; EXCITED STATES; PHOTONS; ULTRAVIOLET SPECTROSCOPY; URANIUM METALLOGRAPHY; VANADIUM METALLOGRAPHY;

ELECTRONIC TRANSITION; FEMTOSECOND FREQUENCY COMBS; FREQUENCY COMB SPECTROSCOPIES; MAGNETOOPTICAL TRAPS; PRECISION MEASUREMENT; RESONANT TWO-PHOTON EXCITATION; TWO-PHOTON EXCITATIONS; ULTRAVIOLET SPECTRAL REGIONS;

HELIUM;

EID: 44449155352     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2007-00289-y     Document Type: Article

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