On the quantitative analysis of secondary carbide and carbon in (Ti1-xMx)C solid solutions via XRD measurements

International Journal of Refractory Metals and Hard Materials

Volumn 26, Issue 5, 2008, Pages 444-448

  Kim, Taehyung ^a   Kang, Shinhoo ^a  

^a Seoul National University   (South Korea)

Author keywords

(Ti, M)C solid solutions; Carbides; Composition; Diffraction peaks; XRD

Indexed keywords

CARBON; COMPUTER SIMULATION; SOLID SOLUTIONS; TITANIUM; X RAY DIFFRACTION;

CARBON NON-STOICHIOMETRY; DIFFRACTION PEAKS; STRUCTURE FACTOR CALCULATIONS;

SODIUM CHLORIDE;

EID: 44449143435     PISSN: 02634368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijrmhm.2007.10.001     Document Type: Article

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