Interface width of immiscible layered elements

International Journal of Materials Research

Volumn 99, Issue 5, 2008, Pages 480-486

  Stender, Patrick ^a   Ene, Constantin Buzau ^a   Galinski, Henning ^a   Schmitz, Guido ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Ag Cu, Cu NiFe; Atom probe tomography; Cahn Hilliard theory; Gradient energy coefficient; Interfacial chemistry

Indexed keywords

GIBBS FREE ENERGY; OPTICAL RESOLVING POWER; TERNARY SYSTEMS;

ATOM PROBE TOMOGRAPHY; CAHN-HILLIARD THEORY; GRADIENT ENERGY COEFFICIENT;

INTERFACES (MATERIALS);

EID: 44449110514     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.101661     Document Type: Article

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