Thickness reduction in CoPtCr-SiO2 perpendicular recording media to improve media performance

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2461-2463

  Shimatsu, T ^a   Oikawa, T ^b   Inaba, Y ^a   Sato, H ^a   Watanabe, I ^a   Aoi, H ^a   Muraoka, H ^a   Nakamura, Y ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b FUJI ELECTRIC CO   (Japan)

Author keywords

Coercivity; CoPtCr SiO2; Magnetic anisotropy; Media noise; Perpendicular recording media; SiO2 content; Thermal agitation of magnetization

Indexed keywords

COBALT COMPOUNDS; COERCIVE FORCE; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETOMETERS; MICROSTRUCTURE; SILICA; SPURIOUS SIGNAL NOISE; THERMODYNAMIC STABILITY; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COPTCR-SIO2; MEDIA NOISE; PERPENDICULAR RECORDING MEDIA; SIO2 CONTENT; THERMAL AGITATION OF MAGNETIZATION;

MAGNETIC RECORDING;

EID: 4444366198     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.832359     Document Type: Article

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