A high-sensitivity system for cathodoluminescent studies with the camebax electron probe microanalyzer

Instruments and Experimental Techniques

Volumn 47, Issue 4, 2004, Pages 477-483

  Zamoryanskaya, M V ^a   Konnikov, S G ^a   Zamoryanskii, A N ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4444353590     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:INET.0000038392.08043.d6     Document Type: Article

References (9)

1. Zamoryanskaya, M.V., Petrova, M.A., and Korovkin, A.M., Neorg. Mater., 1996, vol. 32, no. 5, p. 593.
2. Khilko, A.Yu., Gastev, S.V., Kyutt, R.N., et al., Appl. Surf. Sci, 1998, vols. 123/124, p. 595.
3. Danichevskiy, A.M., Sytnikova, A.A., Zamoryanskaya, M.V., et al., Semicond. Sci. Technol., 1998, vol. 13, p. 1111.
4. Zamoryanskaya, M.V., Sokolov, V.I., Sitnikova, A.A., and Konnikov, C.G., Solid State Phenomena, 1998, vols. 63-64, p. 237.
5. Zamoryanskaya, M.V. and Pis'mennyi, V.A., Neorg. Mater., 2000, vol. 36, no. 6, p. 749.
6. Zamoryanskaya, M.V. and Burakov, B.E., Neorg. Mater., 2000, vol. 36, no. 8, p. 844.
7. Ulin, V.P., Zamoryanskaya, M.V., Soldatenkov, Yu.F., and Konnikov, S.G., Solid State Phenomena, 2001, vols. 78/79, p. 301.
8. Zamoryanskaya, M.V., Sokolov, V.I., Kotina, I.M., and Konnikov, C.G., Abstracts of Papers, 7th Int. Symp. on Silicon Nitride and Silicon Dioxide Thin Insulating Films, Paris, 2003, p. 348.
9. Zamoryanskaya, M.V., Vainshenker, I.A., and Zamoryanskii, A.N., Prib. Tekh. Eksp., 1987, no. 4, p. 192.