The application of sputtered thin film in advanced recording tape media

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2404-2406

  Lee, Hwan Soo ^a,b   Bain, James A ^a,b   Laughlin, David E ^a,b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Anisotropic magnetoresistive (AMR) head; Corrosion resistive; Overwrite; Recording characteristics; Sputtered tape media

Indexed keywords

BANDWIDTH; CORROSION RESISTANCE; MAGNETIC ANISOTROPY; MAGNETIC RECORDING; MAGNETIC TAPE; SIGNAL TO NOISE RATIO; SPUTTERING; WAVEFORM ANALYSIS;

ANISOTROPIC MAGNETORESISTIVE (AMR) HEAD; OVERWRITE; RECORDING CHARACTERISTICS; SPUTTERED TAPE MEDIA;

THIN FILMS;

EID: 4444348718     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.828985     Document Type: Article

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