Magnetic resistivity measurements in nickel films for CIW and CPW domain geometries

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2242-2244

  Snowden, D S ^a   Checkelsky, J G ^a   Harberger, S S ^a   Stern, N P ^b   Eckert, J C ^a   Sparks, P D ^a  

^a HARVEY MUDD COLLEGE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Domain wall resistance; Magnetoresistance; Nickel; Striped magnetic domains

Indexed keywords

DEPOSITION; ELECTRIC POTENTIAL; ETCHING; FERROMAGNETISM; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETORESISTANCE; MOLYBDENUM; NICKEL; SUBSTRATES; THIN FILMS;

ANISOTROPIC MAGNETORESISTANCE (AMR); CURRENT PERPENDICULAR TO THE DOMAIN WALLS (CPW); DOMAIN-WALL RESISTANCE; STRIPED MAGNETIC DOMAINS;

MAGNETIC DOMAINS;

EID: 4444335560     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.830450     Document Type: Article

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