High-performance photorefractive polymer operating at 975 nm

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1095-1097

  Eralp, Muhsin ^a   Thomas, Jayan ^a   Tay, Savaş ^a   Li, Guoqiang ^a   Meredith, Gerald ^a   Schülzgen, Axel ^a   Peyghambarian, N ^a   Walker, Gregory A ^b   Barlow, Stephen ^b,c   Marder, Seth R ^b,c  

^a UNIVERSITY OF ARIZONA   (United States)

^b University of Arizona   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE OPERATION; PHOTOREFRACTIVE POLYMERS; POLYMER COMPOSITES; WAVELENGTHS;

CHROMOPHORES; COMPOSITE MATERIALS; CRYSTALLIZATION; DIFFRACTION GRATINGS; ELECTRIC SPACE CHARGE; ELECTRODES; ELLIPSOMETRY; HOLOGRAPHY; LAMINATING; ORGANIC POLYMERS; PHOTOCONDUCTIVITY; REFRACTIVE INDEX;

PHOTOREFRACTIVE MATERIALS;

EID: 4444334947     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1780591     Document Type: Article

References (19)

1. Photorefractive Materials and Their Applications, edited by P. Günter and J. P. Huignard (Springer, New York, 1988), Vol. 2.
2. W. E. Moerner, A. Grunnet-Jepsen, and C. L. Thompson, Annu. Rev. Mater. Sci. 27, 585 (1997).
3. B. Kippelen, S. R. Marder, E. Hendrickx, J. L. Maldonado, G. Guillemet, B. L. Volodin, D. D. Steele, Y. Enami, Sandalphon, Y. J. Yao, J. F. Wang, H. Rockel, L. Erskine, and N. Peyghambarian, Science 279, 54 (1998).
4. D. Wright, M. A. Diaz-Garcia, J. D. Casperson, M. DeClue, W. E. Moerner, and R. J. Twieg, Appl. Phys. Lett. 73, 1490 (1998).
5. J. G. Winiarz, L. Zhang, J. Park, and P. N. Prasad, J. Phys. Chem. B 106, 967 (2002).
6. J. G. Winiarz, L. Zhang, M. Lal, C. S. Friend, and P. N. Prasad, J. Am. Chem. Soc, 121, 5287 (1999).
7. C. Engels, D. Van Steenwinckel, E. Hendrickx, M. Schaerlaekens, A. Persoons, and C. Samyn, J. Mater. Chem. 12, 951 (2002).
8. E. Mecher, F. Gallego-Gomez, H. Tillmann, H. H. Horhold, J. C. Hummelen, and K. Meerholz, Nature (London) 418, 959 (2002).
9. L. M. Wang, M. K. Ng, and L. P. Yu, Appl. Phys. Lett. 78, 700 (2001).
10. M. A. Díaz-García, D. Wright, J. D. Casperson, B. Smith, E. Glazer, and W. E. Moerner, Chem. Mater. 11, 1784 (1999).
11. M. Ahlheim, M. Barzoukas, P. V. Bedworth, M. Blanchard-Desce, A. Fort, Z.-Y. Hu, S. R. Marder, J. W. Perry, C. Runser, M. Staehelin, and B. Zysset, Science 271, 335 (1996).
12. M. Blanchard-Desce, V. Alain, P. V. Bedworth, S. R. Marder, A. Fort, C. Runser, M. Barzoukas, S. Lebus, and R. Wortmann, Chem.-Eur. J. 3, 1091 (1997).
13. O. Ostroverkhova, W. E. Moerner, M. He, and R. J. Twieg, Appl. Phys. Lett. 82, 3602 (2003).
14. B. Kippelen, Sandalphon, K. Meerholz, and N. Peyghambarian, Appl. Phys. Lett. 68, 1748 (1996).
15. H. Kogelnik, Bell Syst. Tech. J. 2909 (1969); R. Bittner, C. Brauchle, and K. Meerholz, Appl. Opt. 37, 2843 (1998).
16. H. Kogelnik, Bell Syst. Tech. J. 2909 (1969); R. Bittner, C. Brauchle, and K. Meerholz, Appl. Opt. 37, 2843 (1998).
17. N. V. Kuktharev, V. B. Markov, S. G. Odulov, M. S. Soskin, and V. L. Vinetskii, Ferroelectrics 22, 949 (1979).
18. J. A. Herlocker, K. B. Ferrio, E. Hendrickx, B. D. Guenther, S. Mery, B. Kippelen, and N. Peyghambarian, Appl. Phys. Lett. 74, 2253 (1999).
19. C. A. Walsh and W. E. Moerner, J. Opt. Soc. Am. B 9, 642 (1992).