Surface defects on collection coins of precious metals

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 921-924

  Gusmano, G ^a   Montanari, R ^a   Kaciulis, S ^b   Mezzi, A ^b   Montesperelli, G ^c   Rupprecht, L ^d  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b CNR   (Italy)

^c UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

^d Austrian Mint   (Austria)

Author keywords

AES; Depth profiling; Metals; SEM; Surface contamination; XPS

Indexed keywords

AES; COLLECTION COINS; COLOURED STAINS; SURFACE DEFECTS;

CHEMICAL ANALYSIS; COSTS; DEFECTS; ENERGY DISPERSIVE SPECTROSCOPY; FOCUSING; GOLD; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILVER; SPUTTERING; SULFUR; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE PHENOMENA;

EID: 4444334577     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1800     Document Type: Conference Paper

References (7)

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