The myths of reliability demonstration testing!

Test Engineering and Management

Volumn 66, Issue 4, 2004, Pages 16-17

  Kleyner, Andre ^a   Boyle, Joseph ^a  

^a DELPHI CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED TESTS; BINOMIAL DISTRIBUTIONS; SUCCESS RUN TESTING;

AUTOMOTIVE ENGINEERING; COMPUTER SOFTWARE; CUSTOMER SATISFACTION; DATA REDUCTION; MATHEMATICAL MODELS; PROBLEM SOLVING; PRODUCT DEVELOPMENT; QUALITY CONTROL; RANDOM PROCESSES; RELIABILITY THEORY; STATISTICAL METHODS; VEHICLES;

ENVIRONMENTAL TESTING;

EID: 4444310933     PISSN: 01934120     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

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