Correlation between the structural and compositional changes at the solid-liquid interface in submicron Al-Si alloy particles

Philosophical Magazine

Volumn 84, Issue 25-26, 2004, Pages 2619-2634

  Storaska, G A ^a   Moore, K T ^b   Howe, J M ^c  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIGHT-FIELD IMAGING (BFI); ENERGY-FILTERED IMAGING (EFI); SOLID-LIQUID INTERFACES; SPATIAL RESOLUTIONS;

ABSORPTION SPECTROSCOPY; COMPUTER SIMULATION; CORRELATION METHODS; DIFFRACTION; HEATING; INTERFACES (MATERIALS); MATERIALS SCIENCE; SOLIDIFICATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY SCATTERING;

ALUMINUM ALLOYS;

EID: 4444310892     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/14786430410001671395     Document Type: Conference Paper

References (31)

1. ARAI, S., TSUKIMOTO, S., MIYAI, H., and SAKA, H., 1999, J. Electron Microsc., 48, 317.
2. ARAI, S., TSUKIMOTO, S., and SAKA, H., 1998, Microsc. Microanal., 4, 264.
3. BONISSENT, A., and MUTAFTSCHIEV, B., 1977, Phil. Mag., 35, 65.
4. BROUGHTON, J. Q., and GILMER, G. H., 1983, Acta metall., 31, 845.
5. BURTON, J. J., and MACHLIN, E. S., 1976, Phys. Rev. Lett., 37, 1433.
6. CAHN, J. W., HILLIG, W. B., and SEARS, G. W., 1964, Acta metall., 12, 1421.
7. CAHN, J. W., and KIKUCHI, R., 1985, Phys. Rev. B, 31, 4300.
8. DAVIDCHACK, R. L., and LAIRD, B. B., 1996, Phys. Rev. B., 54, R5905.
9. DI CICCO, A., TRAPANANTI, A., FAGGIONI, S., and FILIPPONI, A., 2003, Phys. Rev. Lett., 91, 135505.
10. DONNELLY, S. E., BIRTCHER, R. C., ALLEN, C. W., MORRISON, I., FURUYA, K., SONG, M., MITSUISHI, K., and DAHMEN, U., 2002, Science, 296, 507.
11. EGERTON, R. F., 1996, Electron Energy-Loss Spectroscopy in the Electron Microscope, second edition (New York: Plenum), pp. 272 and 331.
12. FLEMINGS, M. C., 1974, Solidification Processing (New York: McGraw-Hill), pp. 31, 284, 301, 307 and 322.
13. FRANK, F. C., 1952, Proc. R. Soc. A, 215, 43.
14. FULTZ, B., and HOWE, J. M., 2001, Transmission Electron Microscopy and Diffractometry of Materials (Berlin: Springer), pp. 178, 199, 213 and 304.
15. GILMER, G. H., 1993, Handbook of Crystal Growth, Vol. 1, edited by D. J. T. Hurle (Amsterdam: Elsevier), p. 585.
16. HOWE, J. M., 1996, Phil. Mag. A, 74, 761; 1997, Interfaces in Materials (New York: Wiley), pp. 224 and 256.
17. HOWE, J. M., 1996, Phil. Mag. A, 74, 761; 1997, Interfaces in Materials (New York: Wiley), pp. 224 and 256.
18. KURZ, W., and FISHER, D. J., 1989, Fundamentals of Solidification, third edition (Aedermannsdorf: Trans Tech).
19. LAIRD, B. B., and HAYMET, A. D. J., 1992, Chem. Rev., 92, 1819.
20. MOORE, K. T., HOWE, J. M., and VEBLEN, D. R., 2002, Phil. Mag. B, 82, 13.
21. MOORE, K. T., STACH, E. A., Howe, J. M., ELBERT, D. C., and VEBLEN, D. R., 2001a, Micron, 33, 39.
22. MOORE, K. T., VEBLEN, D. R., and HOWE, J. M., 2001b, Am. Mineral., 86, 1314.
23. MURRAY, J. L., and MCALISTER, A. J., 1984, Bull. Alloy Phase Diagrams, 5, 74.
24. RAMALINGHAM, H., ASTA, M., VAN DE WALLE, A., and HOYT, J. J., 2002, Interface Sci., 10, 149.
25. REICHERT, H., KLEIN, O., DOSCH, H., DENK, M., HONKIMAKL, V., LIPPMANN, T., and REITER, G., 2000, Nature, 408, 839.
26. SASAKI, K., and SAKA, H., 1991, Phil. Mag. A, 63, 1207.
27. SPAEPEN, F., 1975, Acta metall., 23, 729; 1994, Solid St. Phys., 47, 1.
28. SPAEPEN, F., 1975, Acta metall., 23, 729; 1994, Solid St. Phys., 47, 1.
29. STORASKA, G. A., 2001, PhD Thesis, University of Virginia, Charlottesville, Virginia, USA.
30. STORASKA, G. A., and HOWE, J. M., 2000, Microscopy and Microanalysis (New York: Springer), p. 1068; 2004, Acta mater. (to be published).
31. STORASKA, G. A., and HOWE, J. M., 2000, Microscopy and Microanalysis (New York: Springer), p. 1068; 2004, Acta mater. (to be published).